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Themis ETEM for Semiconductors and materialsE


Transmission electron microscope on the Titan TEM platform.

 

Next generation microscopy with the possibility of combination S / TEM, which becomes a powerful analyzer for materials science - analysis of chemical bonding and composites, 3D imaging, S / TEM tomography, dynamic analysis, in situ analysis of gas-solid samples.

 

It has a resolution at the atomic level. 

 

Presence of a heated table, which helps to analyze mixtures of components with different morphology and structure.

 

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