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Home / Products / Electron Microscopy / Scanning Electron Spectroscopy (SEM) / Verios 5 XHR SEM

Verios 5 XHR SEM

Verios 5 XHR SEM offers a resolution of 1 nm over the entire energy range from 1 keV to 30 keV with high contrast.

 

It has technology for optics self-aligning.

The microscope comes with seven detectors as standard. It is possible to add more than seven additional detectors. 

 

It is used in the analysis of semiconductors, physical and chemical characterization of various materials. Suitable for analysis of unknown composites.

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